Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model
Συγγραφείς: Lee, Seunggyu, Hyun, Daijoon, Jung, Younggwang, Cho, Gangmin, Shin, Youngsoo
Πηγή: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024
Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9783981926385
ISSN:15581101
DOI:10.23919/DATE58400.2024.10546845