Conference
On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS
| Τίτλος: | On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS |
|---|---|
| Συγγραφείς: | Kim, J., Loveless, T. D., Pew, J., Young, R., Rcising, D., Nour, M., Manos, P., Chambers, M., Barnaby, H. J., Neucndank, J. |
| Πηγή: | 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024 |
| Relation: | 2024 IEEE International Reliability Physics Symposium (IRPS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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