Development of a Technique For Quantitative and Localized Charge Deposition on Dielectric Surfaces

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Development of a Technique For Quantitative and Localized Charge Deposition on Dielectric Surfaces
Συγγραφείς: Limburg, A.A.A., Van De Rakt, L.C., Bell, R., Van Eden, G.G., Nijdam, S.
Πηγή: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2023 IEEE Conference on. :1-4 Oct, 2023
Relation: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798350335620
ISSN:25762397
DOI:10.1109/CEIDP51414.2023.10410493