Research on Automatic Testing Technology of Digital Multimeter Based on B/S Architecture

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Research on Automatic Testing Technology of Digital Multimeter Based on B/S Architecture
Συγγραφείς: Peng, Haiyun
Πηγή: 2022 2nd International Conference on Networking, Communications and Information Technology (NetCIT) NETCIT Networking, Communications and Information Technology (NetCIT), 2022 2nd International Conference on. :379-382 Dec, 2022
Relation: 2022 2nd International Conference on Networking, Communications and Information Technology (NetCIT)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9781665492737
DOI:10.1109/NetCIT57419.2022.00096