Conference
Property-Based Testing of Wafer Handling Robots via Model-Based Planning and Fuzzing
| Τίτλος: | Property-Based Testing of Wafer Handling Robots via Model-Based Planning and Fuzzing |
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| Συγγραφείς: | Xu, Ruiyang, Liang, Jingjing, Zheng, Guoyue, Pu, Geguang, Su, Ting |
| Πηγή: | Proceedings of the 41st IEEE/ACM International Conference on Automated Software Engineering. :374-385 |
| Διαθεσιμότητα: | http://dl.acm.org/doi/10.1145/3832783.3834360 |
| Βάση Δεδομένων: | ACM Full-Text Collection |
| DOI: | 10.1145/3832783.3834360 |
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