Παραπομπή σε μορφή APA (7η εκδ.)

Nakamura, I., Kashiwa, Y., Lin, B., & Iida, H. (2026). Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study. ACM Transactions on Software Engineering and Methodology, 35(9), 1-35. https://doi.org/10.1145/3786791

Παραπομπή σε μορφή Chicago (17η εκδ.)

Nakamura, Ibuki, Yutaro Kashiwa, Bin Lin, και Hajimu Iida. "Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study." ACM Transactions on Software Engineering and Methodology 35, no. 9 (2026): 1-35. https://doi.org/10.1145/3786791.

Παραπομπή σε μορφή MLA (9th εκδ.)

Nakamura, Ibuki, et al. "Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study." ACM Transactions on Software Engineering and Methodology, vol. 35, no. 9, 2026, pp. 1-35, https://doi.org/10.1145/3786791.