Academic Journal
Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study
| Τίτλος: | Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study |
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| Συγγραφείς: | Nakamura, Ibuki, Kashiwa, Yutaro, Lin, Bin, Iida, Hajimu |
| Πηγή: | ACM Transactions on Software Engineering and Methodology. 35(9):1-35 |
| Διαθεσιμότητα: | http://dl.acm.org/doi/10.1145/3786791 |
| Βάση Δεδομένων: | ACM Full-Text Collection |
| ISSN: | 1049331X 15577392 |
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| DOI: | 10.1145/3786791 |