Academic Journal
View in EDS

Exploring JVM Garbage Collector Testing with Event-Coverage

Bibliographic Details
Title: Exploring JVM Garbage Collector Testing with Event-Coverage
Authors: Zheng, Kai, Wang, Zan, Zhao, Yingquan, Chen, Junjie, You, Hanmo, Wang, Haoyu, Du, Yiheng, Gao, Tianchang
Source: ACM Transactions on Software Engineering and Methodology. 35(2):1-38
Availability: http://dl.acm.org/doi/10.1145/3733598
Database: ACM Full-Text Collection
Description
ISSN:1049331X
15577392
DOI:10.1145/3733598