Conference
Mutation Testing of Java Bytecode: A Model-Driven Approach
| Τίτλος: | Mutation Testing of Java Bytecode: A Model-Driven Approach |
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| Συγγραφείς: | Bockisch, Christoph, Eren, Deniz, Lehmann, Sascha, Neufeld, Daniel, Taentzer, Gabriele |
| Πηγή: | Proceedings of the ACM/IEEE 27th International Conference on Model Driven Engineering Languages and Systems. :237-248 |
| Διαθεσιμότητα: | http://dl.acm.org/doi/10.1145/3640310.3674103 |
| Βάση Δεδομένων: | ACM Full-Text Collection |
| DOI: | 10.1145/3640310.3674103 |
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