Academic Journal

Effect of the shot-to-shot variation on charge migration induced by sub-fs x-ray free-electron laser pulses

Bibliographic Details
Title: Effect of the shot-to-shot variation on charge migration induced by sub-fs x-ray free-electron laser pulses
Authors: Grell, Gilbert, Guo, Zhaoheng, Driver, Taran, Decleva, Piero, Plésiat, Etienne, Picón Álvarez, Antonio, González Vázquez, Jesús, Walter, Peter, Marangos, Jonathan P., Cryan, James P., Marinelli, Agostino, Palacios Cañas, Alicia, Martín García, Fernando
Contributors: Departamento de Química, Facultad de Ciencias
Publisher Information: American Physical Society
Publication Year: 2023
Collection: Universidad Autónoma de Madrid (UAM): Biblos-e Archivo
Subject Terms: Electrons, Free Electron Lasers, Stochastic Systems, Química
Description: X-ray free-electron lasers (XFELs) are now able to provide tunable pairs of intense sub-fs pulses in the soft x-ray regime, paving the way for time-resolved investigations of attosecond charge migration in molecules. However, the stochastic shot-to-shot variation of the XFEL pulses may degrade and eventually hide the observable features. We show by means of state-of-the-art calculations that the damping of the charge migration induced by 260 eV pulses in p-aminophenol due to the shot-to-shot variation of pulses generated at the Linac Coherent Light Source is negligible in comparison to the natural damping due to the intrinsic fluctuation of the initial molecular geometry. This result gives us confidence in the utility of XFEL sub-fs pulses for the measurement of charge migration and other ultrafast charge dynamics ; Y2018 NMT-5028, PID2019-105458RB-I00, CEX2020-001039-S, CEX2018-000805-M
Document Type: article in journal/newspaper
File Description: application/pdf
Language: English
Relation: Physical Review Research; https://doi.org/10.1103/PhysRevResearch.5.023092; Comunidad de Madrid. Y2018/NMT-5028/FULMATEN-CM; Gobierno de España. PID2019-105458RB-I00; Gobierno de España. CEX2020-001039-S; Gobierno de España. CEX2018-000805-M; Physical Review Research 5.2 (2023): 023092; https://hdl.handle.net/10486/708577
DOI: 10.1103/PhysRevResearch.5.023092
Availability: https://hdl.handle.net/10486/708577
https://doi.org/10.1103/PhysRevResearch.5.023092
Rights: © 2023 authors ; Reconocimiento ; open access
Accession Number: edsbas.E260629
Database: BASE
Description
DOI:10.1103/PhysRevResearch.5.023092