Dissertation/ Thesis
X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites
| Τίτλος: | X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites |
|---|---|
| Συγγραφείς: | Ross, Kirk Campbell |
| Συνεισφορές: | Mitchell, Roger H. |
| Έτος έκδοσης: | 2000 |
| Συλλογή: | Lakehead University Knowledge Commons |
| Θεματικοί όροι: | X-rays Diffraction Data processing, Rietveld method, X-ray crystallography Technique |
| Περιγραφή: | This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document) |
| Τύπος εγγράφου: | thesis |
| Περιγραφή αρχείου: | application/pdf |
| Γλώσσα: | English |
| Relation: | http://knowledgecommons.lakeheadu.ca/handle/2453/1765 |
| Διαθεσιμότητα: | http://knowledgecommons.lakeheadu.ca/handle/2453/1765 |
| Αριθμός Καταχώρησης: | edsbas.2D1967AD |
| Βάση Δεδομένων: | BASE |
| Η περιγραφή δεν είναι διαθέσιμη |