Thickness-dependent quantum oscillations of the transport properties in bismuth selenide thin films

Bibliographic Details
Title: Thickness-dependent quantum oscillations of the transport properties in bismuth selenide thin films
Authors: Rogacheva, E. I., Menshikova, S. I., Sipatov, A. Yu., Nashchekina, O. N.
Source: Thin Solid Films. 684:31-35
Publisher Information: Elsevier BV, 2019.
Publication Year: 2019
Subject Terms: topological insulator, термічне випаровування, electrical conductivity, електрична провідність, товщина, коефіцієнт Зебека, Seebeck coefficient, ефект квантового розміру, 02 engineering and technology, тонкі плівки, 01 natural sciences, thickness, Hall coefficient, thermal evaporation, quantum size effect, thin films, топологічний ізолятор, 0103 physical sciences, вісмут селенід, 0210 nano-technology, коефіцієнт Холла, bismuth selenide
Description: The objects of the present study were thin n-Bi2Se3 films with thicknesses d = 10–100 nm, grown by thermal evaporation of n-Bi2Se3 crystals in vacuum onto heated glass substrates. The room temperature d-dependences of the Seebeck coefficient, the Hall coefficient, and the electrical conductivity of the films exhibited an oscillatory behavior, which we attribute to quantum size effects. Such interpretation of the results is supported by the fact that experimentally determined values of the oscillation period are in quite good agreement with the theoretically calculated ones. We suggest that the large amplitude and undamped character of the oscillations in the studied range of thicknesses are connected with the topologically protected gapless surface states of Bi2Se3. The observed oscillatory character of the d-dependences of the transport coefficients should be taken into account when 2D-structures are applied in nanothermoelectricity and other fields of nanoscience and nanotechnology.
Document Type: Article
File Description: application/pdf
Language: English
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2019.05.046
Access URL: https://www.sciencedirect.com/science/article/pii/S0040609019303244
http://ui.adsabs.harvard.edu/abs/2019TSF...684...31R/abstract
http://repository.kpi.kharkov.ua/handle/KhPI-Press/61637
Rights: Elsevier TDM
Accession Number: edsair.doi.dedup.....2b966c75a0061c6096e4d0451b4c4598
Database: OpenAIRE
Description
ISSN:00406090
DOI:10.1016/j.tsf.2019.05.046