Bibliographic Details
| Title: |
Structure and substructure properties of magnesium oxide thin films |
| Authors: |
Diachenko, Oleksii Viktorovych, Opanasiuk, Anatolii Serhiiovych, Kurbatov, Denys Ihorovych, Panchal, Ch. |
| Publisher Information: |
Proceedings of International Symposium on Semiconductor Materials and Devices, 2015. |
| Publication Year: |
2015 |
| Subject Terms: |
рентгеноструктурный анализ, спрей пиролиз, MgO, 02 engineering and technology, x-ray diffraction analysis, микронапряжение, microstrain, рентгеноструктурний аналіз, 01 natural sciences, 0104 chemical sciences, спрей піроліз, мікронапруга, 0210 nano-technology, spray pyrolysis |
| Description: |
In this paper we have conducted a comprehensive study of the structural and substructural characteristics of magnesium oxide films by X-ray diffraction analysis. Thin films MgO were prepared by spray pyrolysis technique from a magnesium chloride solution. Identified the phase composition, the lattice constant, crystallite size and coherent scattering domain size, microstrain level of the films. The optimal conditions for the application of homogeneous single-phase films of stoichiometric composition were identified. This research was supported by the Ministry of Education and Science of Ukraine (Grant No. 0113U000131, No. 0112U000772). |
| Document Type: |
Article |
| File Description: |
application/pdf |
| Language: |
English |
| Access URL: |
http://essuir.sumdu.edu.ua/handle/123456789/43177 |
| Accession Number: |
edsair.dedup.wf.002..e233f5b4b932db56e6d85b68201cd3fe |
| Database: |
OpenAIRE |