Conference
Optimal voltage testing for physically-based faults.
| Τίτλος: | Optimal voltage testing for physically-based faults. |
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| Συγγραφείς: | Yuyun Liao, Walker, D.M.H. |
| Πηγή: | Proceedings of 14th VLSI Test Symposium; 1996, p344-353, 10p |
| Βάση Δεδομένων: | Complementary Index |
| ISBN: | 9780818673047 |
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| DOI: | 10.1109/VTEST.1996.510878 |