| Περίληψη: |
The transition toward smart grids and Industry 4.0 demands a fundamental shift in maintenance strategies, as manual inspection methods are increasingly being supplanted by automated monitoring systems. Among the advanced technologies for smart inspection, infrared imaging has advantages including non-contact operation, intuitive visualization, and predictive capabilities, which has become a cornerstone for autonomous inspection of critical power infrastructure. This review provides recent advancements in infrared imaging, with a specific focus on automated power system inspection. The discussion starts with an overview of the fundamental principles and system architectures, emphasizing the pivotal role of infrared detectors. A detailed analysis traces the technological evolution from traditional photon detectors to current uncooled microbolometers, and critically assesses emerging low-dimensional materials. The analysis highlights inherent performance trade-offs among sensitivity, operating temperature, and fabrication cost. Subsequently, the review explores advanced signal processing algorithms, such as real-time non-uniformity correction and adaptive noise suppression, which are typically implemented on FPGA platforms. Advanced optical configurations—encompassing computational imaging, lensless designs, and scattering suppression methods—are also discussed, demonstrating how their convergence enhances image fidelity and operational reliability in complex field environments. Representative application paradigms are surveyed, including drone-based transmission line inspections, patrol robots in substations, and fault diagnosis in photovoltaic plants; for each, operational efficacy and economic benefits are assessed. Despite considerable progress, several challenges persist, notably the performance–stability–cost trilemma in novel detector development, the substantial computational demands of end-to-end optimized systems, and a lack of standardization. Finally, the review outlines future research directions, such as high-performance uncooled arrays, AI-driven co-design of optics and algorithms, and the development of standardized, low-cost, intelligent inspection platforms. [ABSTRACT FROM AUTHOR] |