CHEN, R., SHI, Y., & HUANG, S. (2026). Key words: Multi-label learning; label complexity; feature complexity; sample complexity. Journal of Computer Engineering & Applications, 62(11), 90. https://doi.org/10.3778/j.issn.1002-8331.2511-0253
Παραπομπή σε μορφή Chicago (17η εκδ.)CHEN, Ran, Yaqing SHI, και Song HUANG. "Key Words: Multi-label Learning; Label Complexity; Feature Complexity; Sample Complexity." Journal of Computer Engineering & Applications 62, no. 11 (2026): 90. https://doi.org/10.3778/j.issn.1002-8331.2511-0253.
Παραπομπή σε μορφή MLA (9th εκδ.)CHEN, Ran, et al. "Key Words: Multi-label Learning; Label Complexity; Feature Complexity; Sample Complexity." Journal of Computer Engineering & Applications, vol. 62, no. 11, 2026, p. 90, https://doi.org/10.3778/j.issn.1002-8331.2511-0253.