Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Key words:multi-label learning; label complexity; feature complexity; sample complexity. (English) |
| Συγγραφείς: |
CHEN, Ran, SHI, Yaqing, HUANG, Song |
| Πηγή: |
Journal of Computer Engineering & Applications; 2026, Vol. 62 Issue 11, p90-103, 14p |
| Θεματικοί όροι: |
Heuristic, Computer software testing, Automatic test equipment |
| Περίληψη: |
With the deep application of embedded systems in key fields, embedded software interface testing faces unique challenges different from general software testing due to the deep coupling between hardware and software, strict realtime constraints, and limited device resources. Through a systematic literature review, this paper first clarifies the definition and scope of embedded software interface testing, sorts out the types and core protocol characteristics of embedded software interfaces, and analyzes the difference between its testing process and general software interface testing. Then, it focuses on the evolution of embedded software interface testing technology, and summarizes the research status of automated testing frameworks, testing environment innovation and scenario-specific testing strategies. The paper focuses on the analysis of the core link of test data generation, and compares the advantages, disadvantages and application scenarios of model-based, program analysis-based and search heuristic-based methods. [ABSTRACT FROM AUTHOR] |
|
Copyright of Journal of Computer Engineering & Applications is the property of Beijing Journal of Computer Engineering & Applications Journal Co Ltd. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Βάση Δεδομένων: |
Complementary Index |