Academic Journal

Optimal and near-optimal test sequencing algorithms with realistic test models.

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Optimal and near-optimal test sequencing algorithms with realistic test models.
Συγγραφείς: Raghavan, Vijaya, Shakeri, Mojdeh
Πηγή: IEEE Transactions on Systems, Man & Cybernetics: Part A; Jan99, Vol. 29 Issue 1, p11, 16p, 3 Black and White Photographs, 9 Charts
Θεματικοί όροι: Engineering, Algorithms
Περίληψη: Considers generalized test sequencing problems that incorporate various practical features and develops various test sequencing algorithms and information heuristic-based algorithms to solve the problems. Precedence constraints and setup operations for tests, multi-outcome tests; Modular diagnosis and rectification; Implementation of the algorithms for large problems.
Βάση Δεδομένων: Complementary Index
Περιγραφή
ISSN:10834427
DOI:10.1109/3468.736357