Tshagharyan, G., Harutyunyan, G., Shoukourian, S., & Zorian, Y. (2015). Overview study on fault modeling and test methodology development for FinFET-based memories. 2015 IEEE East-West Design & Test Symposium (EWDTS), 1. https://doi.org/10.1109/EWDTS.2015.7493149
Παραπομπή σε μορφή Chicago (17η εκδ.)Tshagharyan, G., G. Harutyunyan, S. Shoukourian, και Y. Zorian. "Overview Study on Fault Modeling and Test Methodology Development for FinFET-based Memories." 2015 IEEE East-West Design & Test Symposium (EWDTS) 2015: 1. https://doi.org/10.1109/EWDTS.2015.7493149.
Παραπομπή σε μορφή MLA (9th εκδ.)Tshagharyan, G., et al. "Overview Study on Fault Modeling and Test Methodology Development for FinFET-based Memories." 2015 IEEE East-West Design & Test Symposium (EWDTS), 2015, p. 1, https://doi.org/10.1109/EWDTS.2015.7493149.