Conference
Overview study on fault modeling and test methodology development for FinFET-based memories.
| Τίτλος: | Overview study on fault modeling and test methodology development for FinFET-based memories. |
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| Συγγραφείς: | Tshagharyan, G., Harutyunyan, G., Shoukourian, S., Zorian, Y. |
| Πηγή: | 2015 IEEE East-West Design & Test Symposium (EWDTS); 2015, p1-4, 4p |
| Βάση Δεδομένων: | Complementary Index |
| ISBN: | 9781467377768 |
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| DOI: | 10.1109/EWDTS.2015.7493149 |