BT, O., J, A., B, D., T, M., M, A., JO, A., . . . FC, O. (2026). Phytochemical profiling of sorghum grains (Sorghum bicolor) irradiated with gamma rays, low energy electron beam (LEEB) and high energy electron beam (HEEB). Food science and technology international = Ciencia y tecnologia de los alimentos internacional, 32(7), 741. https://doi.org/10.1177/10820132251367495
Παραπομπή σε μορφή Chicago (17η εκδ.)BT, Odai, et al. "Phytochemical Profiling of Sorghum Grains (Sorghum Bicolor) Irradiated with Gamma Rays, Low Energy Electron Beam (LEEB) and High Energy Electron Beam (HEEB)." Food Science and Technology International = Ciencia Y Tecnologia De Los Alimentos Internacional 32, no. 7 (2026): 741. https://doi.org/10.1177/10820132251367495.
Παραπομπή σε μορφή MLA (9th εκδ.)BT, Odai, et al. "Phytochemical Profiling of Sorghum Grains (Sorghum Bicolor) Irradiated with Gamma Rays, Low Energy Electron Beam (LEEB) and High Energy Electron Beam (HEEB)." Food Science and Technology International = Ciencia Y Tecnologia De Los Alimentos Internacional, vol. 32, no. 7, 2026, p. 741, https://doi.org/10.1177/10820132251367495.