Academic Journal
Subnanometer localization accuracy in widefield optical microscopy.
| Τίτλος: | Subnanometer localization accuracy in widefield optical microscopy. |
|---|---|
| Συγγραφείς: | Copeland CR; 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.; 2Maryland NanoCenter, University of Maryland, College Park, MD 20742 USA., Geist J; 3Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA., McGray CD; 3Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA., Aksyuk VA; 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA., Liddle JA; 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA., Ilic BR; 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA., Stavis SM; 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 USA. |
| Πηγή: | Light, science & applications [Light Sci Appl] 2018 Jul 11; Vol. 7, pp. 31. Date of Electronic Publication: 2018 Jul 11 (Print Publication: 2018). |
| Τύπος έκδοσης: | Journal Article |
| Γλώσσα: | English |
| Στοιχεία περιοδικού: | Publisher: Springer Nature Country of Publication: England NLM ID: 101610753 Publication Model: eCollection Cited Medium: Internet ISSN: 2047-7538 (Electronic) Linking ISSN: 20477538 NLM ISO Abbreviation: Light Sci Appl Subsets: PubMed not MEDLINE |
| Imprint Name(s): | Original Publication: [London] : Springer Nature, [2012]- |
| Περίληψη: | The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue-overconfidence in measurement results with nanoscale statistical uncertainties that can be invalid due to microscale systematic errors. In this article, we report a comprehensive solution to this underappreciated problem. We develop arrays of subresolution apertures into the first reference materials that enable localization errors approaching the atomic scale across a submillimeter field. We present novel methods for calibrating our microscope system using aperture arrays and develop aberration corrections that reach the precision limit of our reference materials. We correct and register localization data from multiple colors and test different sources of light emission with equal accuracy, indicating the general applicability of our reference materials and calibration methods. In a first application of our new measurement capability, we introduce the concept of critical-dimension localization microscopy, facilitating tests of nanofabrication processes and quality control of aperture arrays. In a second application, we apply these stable reference materials to answer open questions about the apparent instability of fluorescent nanoparticles that commonly serve as fiducial markers. Our study establishes a foundation for subnanometer localization accuracy in widefield optical microscopy. |
| Competing Interests: | The authors declare that they have no conflict of interest. |
| References: | Proc Natl Acad Sci U S A. 2013 Jul 23;110(30):E2812-20. (PMID: 23821748) Nat Methods. 2014 Mar;11(3):253-66. (PMID: 24577276) Nat Commun. 2015 Oct 16;6:8621. (PMID: 26509412) Nat Methods. 2013 Jan;10(1):60-3. (PMID: 23223154) Nat Commun. 2017 May 03;8:15115. (PMID: 28466844) Science. 2012 Jan 13;335(6065):221-5. (PMID: 22157083) Sci Rep. 2016 Jul 06;6:28680. (PMID: 27381055) J Microsc. 2004 Oct;216(Pt 1):32-48. (PMID: 15369481) Nature. 2012 Jul 5;487(7405):64-9. (PMID: 22763440) Nat Commun. 2016 Jul 25;7:12290. (PMID: 27452975) Nature. 2010 Jul 29;466(7306):647-51. (PMID: 20613725) Nat Commun. 2015 Jan 07;6:5885. (PMID: 25565216) J Opt Soc Am A Opt Image Sci Vis. 2001 Sep;18(9):2072-8. (PMID: 11551037) Opt Express. 2013 Jul 1;21(13):15131-43. (PMID: 23842300) Nat Methods. 2010 May;7(5):377-81. (PMID: 20364147) Nat Methods. 2013 Jul;10(7):653-8. (PMID: 23708387) J Cell Biol. 2009 Jun 29;185(7):1135-48. (PMID: 19564400) Biophys J. 2002 May;82(5):2775-83. (PMID: 11964263) Opt Express. 2017 May 15;25(10):11701-11716. (PMID: 28788730) Phys Chem Chem Phys. 2014 Oct 21;16(39):21586-94. (PMID: 25189193) Opt Express. 2012 May 21;20(11):12177-83. (PMID: 22714205) PLoS One. 2015 Nov 23;10(11):e0142949. (PMID: 26600467) Angew Chem Int Ed Engl. 2009;48(47):8870-3. (PMID: 19830751) J Microsc. 2017 Jun;266(3):298-306. (PMID: 28328030) Biophys J. 2005 Mar;88(3):2126-36. (PMID: 15596511) Optica. 2015 Nov 20;2(11):985-993. (PMID: 26973863) Nat Photonics. 2016 Nov;10(11):705-708. (PMID: 27818707) Opt Express. 2015 Sep 7;23(18):23887-98. (PMID: 26368482) J Res Natl Inst Stand Technol. 2016 Oct 19;121:464-475. (PMID: 34434635) Nat Methods. 2012 Jun 10;9(7):724-6. (PMID: 22688415) J Microsc. 2016 Sep;263(3):238-49. (PMID: 26970565) Microsyst Nanoeng. 2016;2:16055. (PMID: 27840694) Opt Express. 2013 Dec 2;21(24):29462-87. (PMID: 24514501) Nat Methods. 2014 Mar;11(3):267-79. (PMID: 24577277) Appl Opt. 2007 Jan 20;46(3):421-7. (PMID: 17228390) Biophys J. 2017 May 23;112(10):2196-2208. (PMID: 28538156) Anal Chem. 2015 Jun 16;87(12):6419-24. (PMID: 26011175) Science. 2003 Jun 27;300(5628):2061-5. (PMID: 12791999) Opt Express. 2009 Dec 21;17(26):23352-73. (PMID: 20052043) J Microsc. 2004 Oct;216(Pt 1):49-51. (PMID: 15369482) Appl Phys Rev. 2016 Mar;3(1):. (PMID: 27213022) |
| Entry Date(s): | Date Created: 20190307 Latest Revision: 20230928 |
| Update Code: | 20260130 |
| PubMed Central ID: | PMC6107003 |
| DOI: | 10.1038/s41377-018-0031-z |
| PMID: | 30839614 |
| Βάση Δεδομένων: | MEDLINE |
| ISSN: | 2047-7538 |
|---|---|
| DOI: | 10.1038/s41377-018-0031-z |