Παραπομπή σε μορφή APA (7η εκδ.)

Haneef, N., Yasir Bashir, M., Adil Raushan, M., & Siddiqui, M. J. (2026). Investigation of P-I-N Forward Leakage in Tunnel FETs: A Simulation Study. IETE Journal of Research, 1-12. https://doi.org/10.1080/03772063.2026.2662392

Παραπομπή σε μορφή Chicago (17η εκδ.)

Haneef, Nazia, Md Yasir Bashir, Mohd Adil Raushan, και Mohammad Jawaid Siddiqui. "Investigation of P-I-N Forward Leakage in Tunnel FETs: A Simulation Study." IETE Journal of Research 2026: 1-12. https://doi.org/10.1080/03772063.2026.2662392.

Παραπομπή σε μορφή MLA (9th εκδ.)

Haneef, Nazia, et al. "Investigation of P-I-N Forward Leakage in Tunnel FETs: A Simulation Study." IETE Journal of Research, 2026, pp. 1-12, https://doi.org/10.1080/03772063.2026.2662392.