Stability of current and potential in arduino-controlled resistivity meter.

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Stability of current and potential in arduino-controlled resistivity meter.
Συγγραφείς: Hamdalah, Hafiz1 (AUTHOR) hafizhamdalah@upnyk.ac.id, Giamboro, Wrego Seno1 (AUTHOR), Setiawan, Agris2 (AUTHOR), Pratama, Yudha Agung1 (AUTHOR), Anwar, Aldino Putra1 (AUTHOR), Safitri, Erika Ditya1 (AUTHOR), Subekti, Sunu1 (AUTHOR)
Πηγή: AIP Conference Proceedings. 2026, Vol. 3374 Issue 1, p1-9. 9p.
Θεματικοί όροι: *Arduino (Microcontroller), *Automatic data collection systems, *Measuring instruments, *Statistical reliability, *Geophysical prospecting, *Geophysical observations, *Microcontrollers
Περίληψη: Accuracy of rock resistivity measurements at subsurface is the most important in geoelectrical exploration. One of factors is stability of current and potential measurement by resistivity-meter. Resistivity-meter with manual system often results in unstable readings of current and potential values. This research tried to build resistivity-meter with automatic system controlled by Arduino microcontroller. This system to help speed up of data collection and stability of current and electric potential measurement caused by differences medium at subsurface. Based on laboratory tests with a circuit made to resemble measurements in the field, where the target resistance (R1) and surface soil resistance (R2) and C1 and C2 are the current. R1 (target resistance) varies from resistor 0.22, 0.5, 1, 5, 20, 100, 470, 2000 Ohm and R2 varies from 50, 100, 470, 1000, 2000, 3000, and 5000 ohm, to maintain performance and increase the temperature of resistor monitored using thermometer. The measurement results show the stability of the resistivity-meter readings with a microcontroller system with an average error of under 5% for current, potential and resistance parameters with various variations in R1 and R2 measurements, so it can be concluded that this tool is ready to carry out measurements on field scale. [ABSTRACT FROM AUTHOR]
Βάση Δεδομένων: Academic Search Index
Περιγραφή
ISSN:0094243X
DOI:10.1063/5.0320367