Periodical
Advanced Testing of Next-Generation DRFM Jammers.
| Τίτλος: | Advanced Testing of Next-Generation DRFM Jammers. |
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| Συγγραφείς: | Mikhailov, Yassen1 |
| Πηγή: | Microwave Journal. Dec2025, Vol. 68 Issue 12, p48-56. 5p. |
| Θεματικοί όροι: | *Spectrum analyzers, *Spectrum analysis instruments, *Electronic industries, *Frequency-domain analysis, *Engineering inspection, *Radio interference |
| Περίληψη: | The article evaluates digital radio frequency memory (DRFM) system testers from Rohde & Schwarz including the KM700 pulse analysis software and FSWX spectrum and signal analyzer. |
| Βάση Δεδομένων: | Academic Search Index |
| ISSN: | 01926225 |
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