Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Direct calculation of variable‐resolution maps by fully analytic approximations to atomic images. |
| Συγγραφείς: |
Urzhumtsev, Alexandre G.1,2 (AUTHOR) sacha@igbmc.fr, Lunin, Vladimir Y.3 (AUTHOR) |
| Πηγή: |
Journal of Applied Crystallography. Dec2025, Vol. 58 Issue 6, p2144-2148. 5p. |
| Θεματικοί όροι: |
*Spatial resolution, *Electron cryomicroscopy, *Fourier series, *Analytic functions, *Crystallography, *Fourier analysis, *Analytic mappings, *Approximation error |
| Περίληψη: |
Crystallographic maps are typically computed as Fourier series using complex‐valued structure factors, with a single set of coefficients applied across the entire region and associating a single resolution value with the whole map. In cryo‐electron microscopy, however, experimental maps often have variable local resolution. As a consequence, applying the same procedure to compute model maps for comparison with the respective experimental ones becomes complicated. An alternative strategy involves representing model maps as sums of atomic images. They are oscillatory functions of the distance from the atomic center and depend on atomic displacement parameters and local resolution. To calculate such maps, we propose a stand‐alone program which uses the shell‐function approximation of atomic images, making them analytic functions of all their parameters including the local resolution associated with each atom. [ABSTRACT FROM AUTHOR] |
| Βάση Δεδομένων: |
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