Classification, pattern recognition, and reduction of dimensionality

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Bibliographic Details
Other Authors: Krishnaiah, Paruchuri R., Kanal, Laveen N.
Format: Book
Language:English
Published: Amsterdam : New York : New York, N.Y. : North-Holland Pub. Co., Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., c1982
Series:Handbook of statistics ; ; v. 2
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