Academic Journal
A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips
| Τίτλος: | A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips |
|---|---|
| Συγγραφείς: | Zhan, WenfaAff1, Zhou, YangxinziAff1, IDs1083602606221w_cor1, Zeng, XiaoyangAff2, Li, YanAff2 |
| Πηγή: | Journal of Electronic Testing: Theory and Applications. 42(2):167-176 |
| Βάση Δεδομένων: | Springer Nature Journals |
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