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A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips

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Title: A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips
Authors: Zhan, WenfaAff1, Zhou, YangxinziAff1, IDs1083602606221w_cor1, Zeng, XiaoyangAff2, Li, YanAff2
Source: Journal of Electronic Testing: Theory and Applications. 42(2):167-176
Database: Springer Nature Journals
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  – Url: https://dx.doi.org/doi:10.1007/s10836-026-06221-w
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  Data: <i>Journal of Electronic Testing: Theory and Applications</i>. 42(2):167-176
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      – Type: doi
        Value: 10.1007/s10836-026-06221-w
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      – Text: English
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        PageCount: 10
        StartPage: 167
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      – TitleFull: A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips
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            NameFull: Zhan, Wenfa
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            NameFull: Zhou, Yangxinzi
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            NameFull: Zeng, Xiaoyang
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            NameFull: Li, Yan
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            – D: 01
              M: 04
              Type: published
              Y: 2026
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              Value: 42
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              Value: 2
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            – TitleFull: Journal of Electronic Testing: Theory and Applications
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