Zhan, W., Zhou, Y., Zeng, X., & Li, Y. (2026). A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips. Journal of Electronic Testing: Theory and Applications, 42(2), 167. https://doi.org/10.1007/s10836-026-06221-w
Παραπομπή σε μορφή Chicago (17η εκδ.)Zhan, Wenfa, Yangxinzi Zhou, Xiaoyang Zeng, και Yan Li. "A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips." Journal of Electronic Testing: Theory and Applications 42, no. 2 (2026): 167. https://doi.org/10.1007/s10836-026-06221-w.
Παραπομπή σε μορφή MLA (9th εκδ.)Zhan, Wenfa, et al. "A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips." Journal of Electronic Testing: Theory and Applications, vol. 42, no. 2, 2026, p. 167, https://doi.org/10.1007/s10836-026-06221-w.