Academic Journal
A knowledge-guided, drift-aware computer vision pipeline for automated nanoscale atomic force microscope surface characterization
| Τίτλος: | A knowledge-guided, drift-aware computer vision pipeline for automated nanoscale atomic force microscope surface characterization |
|---|---|
| Συγγραφείς: | Barandır, T. Karakoyun a, Deveci, Derya Gemici b, ⁎, Ünverdi, Ö. c, Çelebi, C. a |
| Πηγή: | In Ultramicroscopy August 2026 285 |
| Βάση Δεδομένων: | ScienceDirect |
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