Conference
In-depth Testing of x86 Instruction Disassemblers with Feedback Controlled DFS Algorithm
| Τίτλος: | In-depth Testing of x86 Instruction Disassemblers with Feedback Controlled DFS Algorithm |
|---|---|
| Συγγραφείς: | Wang, Guang, Zhu, Ziyuan, Cheng, Xu, Meng, Dan |
| Πηγή: | 2022 IEEE 40th International Conference on Computer Design (ICCD) ICCD Computer Design (ICCD), 2022 IEEE 40th International Conference on. :463-470 Oct, 2022 |
| Relation: | 2022 IEEE 40th International Conference on Computer Design (ICCD) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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