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In-depth Testing of x86 Instruction Disassemblers with Feedback Controlled DFS Algorithm

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Τίτλος: In-depth Testing of x86 Instruction Disassemblers with Feedback Controlled DFS Algorithm
Συγγραφείς: Wang, Guang, Zhu, Ziyuan, Cheng, Xu, Meng, Dan
Πηγή: 2022 IEEE 40th International Conference on Computer Design (ICCD) ICCD Computer Design (ICCD), 2022 IEEE 40th International Conference on. :463-470 Oct, 2022
Relation: 2022 IEEE 40th International Conference on Computer Design (ICCD)
Βάση Δεδομένων: IEEE Xplore Digital Library
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  Data: 2022 IEEE 40th International Conference on Computer Design (ICCD) ICCD Computer Design (ICCD), 2022 IEEE 40th International Conference on. :463-470 Oct, 2022
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        Value: 10.1109/ICCD56317.2022.00075
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        PageCount: 8
        StartPage: 463
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      – TitleFull: In-depth Testing of x86 Instruction Disassemblers with Feedback Controlled DFS Algorithm
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            NameFull: Wang, Guang
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            NameFull: Zhu, Ziyuan
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            NameFull: Cheng, Xu
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            NameFull: Meng, Dan
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              Type: published
              Y: 2022
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