Design of robust algorithm for machine learning based on deep search of outliers

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Design of robust algorithm for machine learning based on deep search of outliers
Συγγραφείς: Tang, Minghu
Πηγή: 2022 6th International Conference on Trends in Electronics and Informatics (ICOEI) Trends in Electronics and Informatics (ICOEI), 2022 6th International Conference on. :1343-1347 Apr, 2022
Relation: 2022 6th International Conference on Trends in Electronics and Informatics (ICOEI)
Βάση Δεδομένων: IEEE Xplore Digital Library
FullText Text:
  Availability: 0
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.9776908
RelevancyScore: 1040
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1040.31982421875
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Design of robust algorithm for machine learning based on deep search of outliers
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Tang%2C+Minghu%22">Tang, Minghu</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2022 6th International Conference on Trends in Electronics and Informatics (ICOEI) Trends in Electronics and Informatics (ICOEI), 2022 6th International Conference on. :1343-1347 Apr, 2022
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2022 6th International Conference on Trends in Electronics and Informatics (ICOEI)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.9776908
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ICOEI53556.2022.9776908
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 1343
    Titles:
      – TitleFull: Design of robust algorithm for machine learning based on deep search of outliers
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Tang, Minghu
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 28
              M: 04
              Type: published
              Y: 2022
          Identifiers:
            – Type: isbn-print
              Value: 9781665483285
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2022 6th International Conference on Trends in Electronics and Informatics (ICOEI), Trends in Electronics and Informatics (ICOEI), 2022 6th International Conference on
              Type: main
ResultId 1