APA (7th ed.) Citation

Sun, C., Ma, Y., Zeng, D., Tan, G., Ma, S., & Wu, Y. (2023). μDep: Mutation-Based Dependency Generation for Precise Taint Analysis on Android Native Code. IEEE Transactions on Dependable and Secure Computing, Dependable and Secure Computing, IEEE Transactions on, IEEE Trans. Dependable and Secure Comput., 20(2), 1461. https://doi.org/10.1109/TDSC.2022.3155693

Chicago Style (17th ed.) Citation

Sun, C., Y. Ma, D. Zeng, G. Tan, S. Ma, and Y. Wu. "μDep: Mutation-Based Dependency Generation for Precise Taint Analysis on Android Native Code." IEEE Transactions on Dependable and Secure Computing, Dependable and Secure Computing, IEEE Transactions on, IEEE Trans. Dependable and Secure Comput. 20, no. 2 (2023): 1461. https://doi.org/10.1109/TDSC.2022.3155693.

MLA (9th ed.) Citation

Sun, C., et al. "μDep: Mutation-Based Dependency Generation for Precise Taint Analysis on Android Native Code." IEEE Transactions on Dependable and Secure Computing, Dependable and Secure Computing, IEEE Transactions on, IEEE Trans. Dependable and Secure Comput., vol. 20, no. 2, 2023, p. 1461, https://doi.org/10.1109/TDSC.2022.3155693.