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Research on technological innovation opportunities based on patent analysis and technological evolution

Bibliographic Details
Title: Research on technological innovation opportunities based on patent analysis and technological evolution
Authors: Li, Miao, Yu, Jiaxin, Yin, Zhijuan, Liu, Qiao
Source: 2021 2nd International Conference on Intelligent Design (ICID) ICID Intelligent Design (ICID), 2021 2nd International Conference on. :466-471 Oct, 2021
Relation: 2021 2nd International Conference on Intelligent Design (ICID)
Database: IEEE Xplore Digital Library
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DbLabel: IEEE Xplore Digital Library
An: edseee.9681524
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PubType: Conference
PubTypeId: conference
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  Data: Research on technological innovation opportunities based on patent analysis and technological evolution
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  Data: 2021 2nd International Conference on Intelligent Design (ICID) ICID Intelligent Design (ICID), 2021 2nd International Conference on. :466-471 Oct, 2021
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  Data: 2021 2nd International Conference on Intelligent Design (ICID)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ICID54526.2021.00097
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 466
    Titles:
      – TitleFull: Research on technological innovation opportunities based on patent analysis and technological evolution
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Li, Miao
      – PersonEntity:
          Name:
            NameFull: Yu, Jiaxin
      – PersonEntity:
          Name:
            NameFull: Yin, Zhijuan
      – PersonEntity:
          Name:
            NameFull: Liu, Qiao
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      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Type: published
              Y: 2021
          Identifiers:
            – Type: isbn-print
              Value: 9781665420655
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              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2021 2nd International Conference on Intelligent Design (ICID), Intelligent Design (ICID), 2021 2nd International Conference on, ICID
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