Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Systematic Error Elimination Method for Mechanical Stability Test Data |
| Συγγραφείς: |
Jie, Bai, Zijia, Liu, Yixuan, Sun |
| Πηγή: |
2021 International Conference on Electronics, Circuits and Information Engineering (ECIE) ECIE Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on. :161-164 Jan, 2021 |
| Relation: |
2021 International Conference on Electronics, Circuits and Information Engineering (ECIE) |
| Βάση Δεδομένων: |
IEEE Xplore Digital Library |