Jie, B., Zijia, L., & Yixuan, S. (2021). Systematic Error Elimination Method for Mechanical Stability Test Data. 2021 International Conference on Electronics, Circuits and Information Engineering (ECIE), Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on, ECIE, 161. https://doi.org/10.1109/ECIE52353.2021.00041
Chicago Style (17th ed.) CitationJie, Bai, Liu Zijia, and Sun Yixuan. "Systematic Error Elimination Method for Mechanical Stability Test Data." 2021 International Conference on Electronics, Circuits and Information Engineering (ECIE), Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on, ECIE 2021: 161. https://doi.org/10.1109/ECIE52353.2021.00041.
MLA (9th ed.) CitationJie, Bai, et al. "Systematic Error Elimination Method for Mechanical Stability Test Data." 2021 International Conference on Electronics, Circuits and Information Engineering (ECIE), Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on, ECIE, 2021, p. 161, https://doi.org/10.1109/ECIE52353.2021.00041.