Jie, B., Zijia, L., & Yixuan, S. (2021). Systematic Error Elimination Method for Mechanical Stability Test Data. 2021 International Conference on Electronics, Circuits and Information Engineering (ECIE), Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on, ECIE, 161. https://doi.org/10.1109/ECIE52353.2021.00041
Παραπομπή σε μορφή Chicago (17η εκδ.)Jie, Bai, Liu Zijia, και Sun Yixuan. "Systematic Error Elimination Method for Mechanical Stability Test Data." 2021 International Conference on Electronics, Circuits and Information Engineering (ECIE), Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on, ECIE 2021: 161. https://doi.org/10.1109/ECIE52353.2021.00041.
Παραπομπή σε μορφή MLA (9th εκδ.)Jie, Bai, et al. "Systematic Error Elimination Method for Mechanical Stability Test Data." 2021 International Conference on Electronics, Circuits and Information Engineering (ECIE), Electronics, Circuits and Information Engineering (ECIE), 2021 International Conference on, ECIE, 2021, p. 161, https://doi.org/10.1109/ECIE52353.2021.00041.