Mironov, S. E., & Andreev, L. E. (2020). Optimization of Complex Microelectronic Systems at Design Rules Uncertainty by the Management of their Elements Matching. 2020 XXIII International Conference on Soft Computing and Measurements (SCM), Soft Computing and Measurements (SCM), 2020 XXIII International Conference on, 80. https://doi.org/10.1109/SCM50615.2020.9198801
Chicago Style (17th ed.) CitationMironov, Sergey E., and Leonid E. Andreev. "Optimization of Complex Microelectronic Systems at Design Rules Uncertainty by the Management of Their Elements Matching." 2020 XXIII International Conference on Soft Computing and Measurements (SCM), Soft Computing and Measurements (SCM), 2020 XXIII International Conference on 2020: 80. https://doi.org/10.1109/SCM50615.2020.9198801.
MLA (9th ed.) CitationMironov, Sergey E., and Leonid E. Andreev. "Optimization of Complex Microelectronic Systems at Design Rules Uncertainty by the Management of Their Elements Matching." 2020 XXIII International Conference on Soft Computing and Measurements (SCM), Soft Computing and Measurements (SCM), 2020 XXIII International Conference on, 2020, p. 80, https://doi.org/10.1109/SCM50615.2020.9198801.