Conference
Language-Agnostic Generation of Compilable Test Programs
| Τίτλος: | Language-Agnostic Generation of Compilable Test Programs |
|---|---|
| Συγγραφείς: | Kreutzer, Patrick, Kraus, Stefan, Philippsen, Michael |
| Πηγή: | 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST) Software Testing, Validation and Verification (ICST), 2020 IEEE 13th International Conference on. :39-50 Oct, 2020 |
| Relation: | 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.9159098 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/ICST46399.2020.00015 PhysicalDescription: Pagination: PageCount: 12 StartPage: 39 Titles: – TitleFull: Language-Agnostic Generation of Compilable Test Programs Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kreutzer, Patrick – PersonEntity: Name: NameFull: Kraus, Stefan – PersonEntity: Name: NameFull: Philippsen, Michael IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Type: published Y: 2020 Identifiers: – Type: isbn-print Value: 9781728157788 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), Software Testing, Validation and Verification (ICST), 2020 IEEE 13th International Conference on Type: main |
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