Feng, H., Chandrasekaran, J., Lei, Y., Kacker, R., & Kuhn, D. R. (2018). A Method-Level Test Generation Framework for Debugging Big Data Applications. 2018 IEEE International Conference on Big Data (Big Data), Big Data (Big Data), 2018 IEEE International Conference on, 221. https://doi.org/10.1109/BigData.2018.8622248
Παραπομπή σε μορφή Chicago (17η εκδ.)Feng, Huadong, Jaganmohan Chandrasekaran, Yu Lei, Raghu Kacker, και D. Richard Kuhn. "A Method-Level Test Generation Framework for Debugging Big Data Applications." 2018 IEEE International Conference on Big Data (Big Data), Big Data (Big Data), 2018 IEEE International Conference on 2018: 221. https://doi.org/10.1109/BigData.2018.8622248.
Παραπομπή σε μορφή MLA (9th εκδ.)Feng, Huadong, et al. "A Method-Level Test Generation Framework for Debugging Big Data Applications." 2018 IEEE International Conference on Big Data (Big Data), Big Data (Big Data), 2018 IEEE International Conference on, 2018, p. 221, https://doi.org/10.1109/BigData.2018.8622248.