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Sparse Recovery of Strong Reflectors with an Application to Non-Destructive Evaluation

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Τίτλος: Sparse Recovery of Strong Reflectors with an Application to Non-Destructive Evaluation
Συγγραφείς: Bezzam, Eric, Besson, Adrien, Pan, Hanjie, Perdios, Dimitris, Thiran, Jean-Philippe, Vetterli, Martin
Πηγή: 2018 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2018 IEEE International. :1-4 Oct, 2018
Relation: 2018 IEEE International Ultrasonics Symposium (IUS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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  Data: 2018 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2018 IEEE International. :1-4 Oct, 2018
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        Value: 10.1109/ULTSYM.2018.8580184
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        PageCount: 4
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      – TitleFull: Sparse Recovery of Strong Reflectors with an Application to Non-Destructive Evaluation
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            NameFull: Besson, Adrien
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            NameFull: Pan, Hanjie
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            NameFull: Perdios, Dimitris
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