Bezzam, E., Besson, A., Pan, H., Perdios, D., Thiran, J., & Vetterli, M. (2018). Sparse Recovery of Strong Reflectors with an Application to Non-Destructive Evaluation. 2018 IEEE International Ultrasonics Symposium (IUS), Ultrasonics Symposium (IUS), 2018 IEEE International, 1. https://doi.org/10.1109/ULTSYM.2018.8580184
Παραπομπή σε μορφή Chicago (17η εκδ.)Bezzam, Eric, Adrien Besson, Hanjie Pan, Dimitris Perdios, Jean-Philippe Thiran, και Martin Vetterli. "Sparse Recovery of Strong Reflectors with an Application to Non-Destructive Evaluation." 2018 IEEE International Ultrasonics Symposium (IUS), Ultrasonics Symposium (IUS), 2018 IEEE International 2018: 1. https://doi.org/10.1109/ULTSYM.2018.8580184.
Παραπομπή σε μορφή MLA (9th εκδ.)Bezzam, Eric, et al. "Sparse Recovery of Strong Reflectors with an Application to Non-Destructive Evaluation." 2018 IEEE International Ultrasonics Symposium (IUS), Ultrasonics Symposium (IUS), 2018 IEEE International, 2018, p. 1, https://doi.org/10.1109/ULTSYM.2018.8580184.