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Dataset Coverage for Testing Machine Learning Computer Programs

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Τίτλος: Dataset Coverage for Testing Machine Learning Computer Programs
Συγγραφείς: Nakajima, Shin, Bui, Hai Ngoc
Πηγή: 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) APSEC Software Engineering Conference (APSEC), 2016 23rd Asia-Pacific. :297-304 2016
Relation: 2016 23rd Asia-Pacific Software Engineering Conference (APSEC)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/APSEC.2016.049
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              Y: 2016
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