Dataset Coverage for Testing Machine Learning Computer Programs

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Dataset Coverage for Testing Machine Learning Computer Programs
Συγγραφείς: Nakajima, Shin, Bui, Hai Ngoc
Πηγή: 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) APSEC Software Engineering Conference (APSEC), 2016 23rd Asia-Pacific. :297-304 2016
Relation: 2016 23rd Asia-Pacific Software Engineering Conference (APSEC)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9781509055753
ISSN:15301362
DOI:10.1109/APSEC.2016.049