Nakajima, S., & Bui, H. N. (2016). Dataset Coverage for Testing Machine Learning Computer Programs. 2016 23rd Asia-Pacific Software Engineering Conference (APSEC), Software Engineering Conference (APSEC), 2016 23rd Asia-Pacific, APSEC, 297. https://doi.org/10.1109/APSEC.2016.049
Παραπομπή σε μορφή Chicago (17η εκδ.)Nakajima, Shin, και Hai Ngoc Bui. "Dataset Coverage for Testing Machine Learning Computer Programs." 2016 23rd Asia-Pacific Software Engineering Conference (APSEC), Software Engineering Conference (APSEC), 2016 23rd Asia-Pacific, APSEC 2016: 297. https://doi.org/10.1109/APSEC.2016.049.
Παραπομπή σε μορφή MLA (9th εκδ.)Nakajima, Shin, και Hai Ngoc Bui. "Dataset Coverage for Testing Machine Learning Computer Programs." 2016 23rd Asia-Pacific Software Engineering Conference (APSEC), Software Engineering Conference (APSEC), 2016 23rd Asia-Pacific, APSEC, 2016, p. 297, https://doi.org/10.1109/APSEC.2016.049.