Conference
A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs
| Τίτλος: | A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs |
|---|---|
| Συγγραφείς: | Trentzsch, M., Flachowsky, S., Richter, R., Paul, J., Reimer, B., Utess, D., Jansen, S., Mulaosmanovic, H., Muller, S., Slesazeck, S., Ocker, J., Noack, M., Muller, J., Polakowski, P., Schreiter, J., Beyer, S., Mikolajick, T., Rice, B. |
| Πηγή: | 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :11.5.1-11.5.4 Dec, 2016 |
| Relation: | 2016 IEEE International Electron Devices Meeting (IEDM) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.7838397 RelevancyScore: 934 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 933.623718261719 |
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| Items | – Name: Title Label: Title Group: Ti Data: A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Trentzsch%2C+M%2E%22">Trentzsch, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Flachowsky%2C+S%2E%22">Flachowsky, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Richter%2C+R%2E%22">Richter, R.</searchLink><br /><searchLink fieldCode="AR" term="%22Paul%2C+J%2E%22">Paul, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Reimer%2C+B%2E%22">Reimer, B.</searchLink><br /><searchLink fieldCode="AR" term="%22Utess%2C+D%2E%22">Utess, D.</searchLink><br /><searchLink fieldCode="AR" term="%22Jansen%2C+S%2E%22">Jansen, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Mulaosmanovic%2C+H%2E%22">Mulaosmanovic, H.</searchLink><br /><searchLink fieldCode="AR" term="%22Muller%2C+S%2E%22">Muller, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Slesazeck%2C+S%2E%22">Slesazeck, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Ocker%2C+J%2E%22">Ocker, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Noack%2C+M%2E%22">Noack, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Muller%2C+J%2E%22">Muller, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Polakowski%2C+P%2E%22">Polakowski, P.</searchLink><br /><searchLink fieldCode="AR" term="%22Schreiter%2C+J%2E%22">Schreiter, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Beyer%2C+S%2E%22">Beyer, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Mikolajick%2C+T%2E%22">Mikolajick, T.</searchLink><br /><searchLink fieldCode="AR" term="%22Rice%2C+B%2E%22">Rice, B.</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :11.5.1-11.5.4 Dec, 2016 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2016 IEEE International Electron Devices Meeting (IEDM) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.7838397 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/IEDM.2016.7838397 PhysicalDescription: Pagination: PageCount: 1 Titles: – TitleFull: A 28nm HKMG super low power embedded NVM technology based on ferroelectric FETs Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Trentzsch, M. – PersonEntity: Name: NameFull: Flachowsky, S. – PersonEntity: Name: NameFull: Richter, R. – PersonEntity: Name: NameFull: Paul, J. – PersonEntity: Name: NameFull: Reimer, B. – PersonEntity: Name: NameFull: Utess, D. – PersonEntity: Name: NameFull: Jansen, S. – PersonEntity: Name: NameFull: Mulaosmanovic, H. – PersonEntity: Name: NameFull: Muller, S. – PersonEntity: Name: NameFull: Slesazeck, S. – PersonEntity: Name: NameFull: Ocker, J. – PersonEntity: Name: NameFull: Noack, M. – PersonEntity: Name: NameFull: Muller, J. – PersonEntity: Name: NameFull: Polakowski, P. – PersonEntity: Name: NameFull: Schreiter, J. – PersonEntity: Name: NameFull: Beyer, S. – PersonEntity: Name: NameFull: Mikolajick, T. – PersonEntity: Name: NameFull: Rice, B. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Type: published Y: 2016 Identifiers: – Type: isbn-print Value: 9781509039029 – Type: isbn-print Value: 9781509039012 – Type: issn-print Value: 2156017X – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2016 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2016 IEEE International Type: main |
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