Zhang, N., Guan, Y., Losavio, M. M., Vasquez, P., Nissen, R. M., Talbot, E., & Roussev, V. (2011). Practitioners' Challenges Panel: The Challenges and Opportunities of Forensic Investigation over Large Data Sets: Timeliness vs Precision vs Comprehensiveness. 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on, 1. https://doi.org/10.1109/SADFE.2011.13
Παραπομπή σε μορφή Chicago (17η εκδ.)Zhang, Nan, Yong Guan, Michael M. Losavio, Peter Vasquez, Robert M. Nissen, Edward Talbot, και Vassil Roussev. "Practitioners' Challenges Panel: The Challenges and Opportunities of Forensic Investigation over Large Data Sets: Timeliness Vs Precision Vs Comprehensiveness." 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on 2011: 1. https://doi.org/10.1109/SADFE.2011.13.
Παραπομπή σε μορφή MLA (9th εκδ.)Zhang, Nan, et al. "Practitioners' Challenges Panel: The Challenges and Opportunities of Forensic Investigation over Large Data Sets: Timeliness Vs Precision Vs Comprehensiveness." 2011 Sixth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, Systematic Approaches to Digital Forensic Engineering (SADFE), 2011 IEEE Sixth International Workshop on, 2011, p. 1, https://doi.org/10.1109/SADFE.2011.13.