Conference
Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead
| Τίτλος: | Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead |
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| Συγγραφείς: | Mehta, Usha Sandeep, Dasgupta, Kankar S., Devashrayee, Niranjan M. |
| Πηγή: | 2010 IEEE Asia Pacific Conference on Circuits and Systems Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on. :40-43 Dec, 2010 |
| Relation: | APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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