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Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead

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Τίτλος: Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead
Συγγραφείς: Mehta, Usha Sandeep, Dasgupta, Kankar S., Devashrayee, Niranjan M.
Πηγή: 2010 IEEE Asia Pacific Conference on Circuits and Systems Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on. :40-43 Dec, 2010
Relation: APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems
Βάση Δεδομένων: IEEE Xplore Digital Library
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PubType: Conference
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  Data: Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead
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  Data: 2010 IEEE Asia Pacific Conference on Circuits and Systems Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on. :40-43 Dec, 2010
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  Data: APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems
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        Value: 10.1109/APCCAS.2010.5774808
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      – TitleFull: Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead
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            NameFull: Dasgupta, Kankar S.
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              Y: 2010
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